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Étude de la transition vers le glissement d'une pointe AFM à la surface de polymèresBASIRE, C; FRETIGNY, C.Journées internationales francophones de tribologie. 2002, pp 3-9, isbn 2-906643-254, 1Vol, 7 p.Conference Paper

Localization of Na⁺―K⁺ ATPases in Quasi-Native Cell MembranesJUNGUANG JIANG; XIAN HAO; MINGJUN CAI et al.Nano letters (Print). 2009, Vol 9, Num 12, pp 4489-4493, issn 1530-6984, 5 p.Article

High-speed micro electrode tool fabrication by a twin-wire EDM systemSHEU, Dong-Yea.Journal of micromechanics and microengineering (Print). 2008, Vol 18, Num 10, issn 0960-1317, 105014.1-105014.5Article

Microprobe array with electrical interconnection for thermal imaging and data storageLEE, Dong-Weon; ONO, Takahito; ABE, Takashi et al.Journal of microelectromechanical systems. 2002, Vol 11, Num 3, pp 215-221, issn 1057-7157Article

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Analysis of pattern collapse of ArF excimer laser resist by direct peeling method with atomic force microscope tipKAWAI, Akira; MORIIKE, Norio.Microelectronic engineering. 2001, Vol 57-58, pp 683-692, issn 0167-9317Conference Paper

Nanoscale phosphorus atom arrays created using STM for the fabrication of a silicon based quantum computerO'BRIEN, J. L; SCHOFIELD, S. R; SIMMONS, M. Y et al.SPIE proceedings series. 2001, pp 299-309, isbn 0-8194-4320-4Conference Paper

Investigation of single asperity microcutting using an Atomic Force MicroscopeZHAO, Qing-Liang; SHEN DONG.euspen : european society for precision engineering and nanotechnology. International conference. 2001, pp 632-635, 2VolConference Paper

A nano-metrology system with a two-dimensional combined optical and X-ray interferometer and an atomic force microscopePARK, Jinwon; LEE, Moo-Yeon; LEE, Dong-Yeon et al.Microsystem technologies. 2009, Vol 15, Num 12, pp 1879-1884, issn 0946-7076, 6 p.Article

Imaging and Detection of Single Molecule Recognition Events on Organic Semiconductor SurfacesPREINER, J; LOSILLA, N. S; EBNER, A et al.Nano letters (Print). 2009, Vol 9, Num 2, pp 571-575, issn 1530-6984, 5 p.Article

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Conformation of a single polyacrylamide molecule adsorbed onto a mica surface studied with atomic force microscopyHASCHKE, Heiko; MILES, Mervyn J; KOUTSOS, Vasileios et al.Macromolecules. 2004, Vol 37, Num 10, pp 3799-3803, issn 0024-9297, 5 p.Article

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Electronic and vibrational excitation of single molecules with a scanning tunneling microscopeLAUHON, L. J; HO, W.Surface science. 2000, Vol 451, Num 1-3, pp 219-225, issn 0039-6028Conference Paper

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Microfabricated small metal cantilevers with silicon tip for atomic force microscopyCHAND, A; VIANI, M. B; SCHÄFFER, T. E et al.Journal of microelectromechanical systems. 1999, Vol 9, Num 1, pp 112-116, issn 1057-7157Article

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Single-molecule force spectroscopy and imaging of the vancomycin/D-Ala-D-Ala interactionGILBERT, Yann; DEGHORAIN, Marie; HOLS, Pascal et al.Nano letters (Print). 2007, Vol 7, Num 3, pp 796-801, issn 1530-6984, 6 p.Article

Nanopatterning by AFM nano-oxidation of thin aluminum layers as a tool for the prototyping of nanoelectromechanical systemsMARTIN, Cristina; DAVIS, Zachary; FORSEN, Esko et al.SPIE proceedings series. 2003, pp 189-196, isbn 0-8194-4978-4, 8 p.Conference Paper

New AFM imaging for an in-line LSI process monitorHOSAKA, Sumio; MORIMOTO, Takafumi; KURODA, Hiroshi et al.SPIE proceedings series. 2002, isbn 0-8194-4435-9, 2Vol, vol 1, 492-499Conference Paper

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